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Equipment

Ion Beam Milling and Twin-Jet Polisher

Ion Beam Milling System Leica EM RES102

Features

• Combines the preparation of TEM, SEM and LM samples in one single benchtop unit
• A variety of sample holders that allows a diverse range of applications
• High-energy ion beam milling as well as gentle sample processing using low ion energy

Fischione Instruments Model 110 Automatic Twin-Jet Electropolisher

Features

• Electrolytic polishing or chemical etching
• Simultaneous two-sided polishing
• No induced artifacts
• Easily adjustable flow rate, jet and specimen positions
• Reliable, accurate termination

Location: WB252

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Last modified: Nov 26, 2019, 19:47 UTC