Equipment
Scanning Electron Microscope
General:
The JEOL JSM-7000F is a general purpose high-performance, low cost scanning electron microscope with excellent Secondary Electron Imaging and Backscattered Electron Imaging resolution. The specimen chamber can accommodate a specimen of up to 100 mm in diameter. Operation training emphasizes manual operation, facilitating better understanding of the basic theory of operation and obtaining optimal images as the user develops skills. The SEM is equipped with Kevex energy dispersive x-ray spectroscopy system, making it suitable for microstructural and chemical analysis of advanced materials.
Specifications
Location: HL047
JEOL JSM-7000F
Scanning Electron Microscope
Transmission Electron Microscope
General:
The JEOL-100CXII is a conventional TEM, optimized for diffraction contrast imaging and electron diffraction studies. It operates at energy up to 100kV. A double tilt holder is available with +/-60 degrees of X tilt and +/-36 degrees of Y tilt. The TEM is used for microstructural and crystallographic studies of a wide variety of materials including metal alloys, polymers, nanostructured materials, and biomaterials.
Specifications
Location: OH028
Transmission Electron Microscope
PANalytical Empyrean
General:
PANalytical Empyrean is a multipurpose diffractometer redesigned to fit the needs of modern materials research. Its ultimate X-ray platform is able to analyze powders, thin films, nanomaterials and solid objects for crystal structure determination, precise lattice parameter measurements, determination of crystalline$ mixtures, phase and residual stress analysis. PANalytical Empyrean features its newly developed essential components, including Empyrean tubes, which allow for robust exchange of tube focus and largest variety of tube anode materials; universal PreFIX optics, stages, and accessories, which eliminate the need for re-ali$ has high resolution, high dynamic range and low noise. Its comprehensive software suite for data collection and analysis supports multiple users, unattended and remote operation, and automatic data collection, analysis and reporting.
Location: WB231
PANalytical Empyrean Diffractometer
Last modified: Dec 22, 2019, 08:45 UTC